topas-editor and TOPilot: tools for AI-driven analysis of diffraction and total scattering data
The power and reliability of the approach is demonstrated using examples including a complex Rietveld refinement with sample- and data-related complications; automatic analysis of multiple data sets; a pipeline from indexing through structure solution to refinement; and fitting PDF data.
John S. O. Evans, O. Wagstaff, I. R. Evans et al.
· 0 citations