Preprint
Sep 2026
Nanometer-scale operando electric field mapping in oxide junctions by correlative STEM-EBIC and 4D-STEM
Understanding local electric fields at oxide interfaces is essential for linking interfacial electrostatics to device functionality, yet conventional electrical measurements infer these fields only indirectly. Here, we combine operando scanning transmission electron microscope electron-beam-induced current (STEM-EBIC)...
Yi-Ning Xie, Eoin Moynihan, Xing-Yao Li et al.
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