Impact of oxidation conditions in SiO2 atomic layer deposition on interface state densities at β -Ga2O3 (001) MOS interfaces with 600 °C post-deposition annealing
We investigated the impact of SiO2 film deposition conditions in either thermal or plasma-enhanced atomic layer depositions (ALDs) on the interface characteristics of β-Ga2O3 metal–oxide–semiconductor (MOS) capacitors, especially focusing on oxidation reaction conditions in ALD. The formation of the interface with an i...