data file - Thickness and topography of two-dimensional materials: atomic force microscopy measurements and polynomial step-function fitting
Raw data for the manuscript entitled:"Thickness and topography of two-dimensionalmaterials: atomic force microscopy measurements andpolynomial step-function fitting"By: Borislav Vasic, Dragana Tizic Matkovic, Muhammad Zubair Khan, Aleksandar Matkovic, Goran IsicJournal: Applied Surface Science AdvancesYear: 2026