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Andreas Peter

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Open access Oct 2026

First high-precision characterisation of the absolute diameter and complete topography of a 30 mm silicon sphere

Spherical reference standards are widely used in metrology as roundness and volume references, and are especially employed in coordinate measuring technology for validating measurement systems. Silicon spheres are of particular interest because their diameter and radius topography can be determined interferometrically...

Eva Kuhn, Andreas Peter · 0 citations

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