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Author

Anushmita Pathak

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Open access Aug 2026

Deep Learning-Based Real-Time Fault Detection in VLSI and Embedded Systems using Intelligent Signal Analysis

A real-time fault detection framework utilising deep learning, which integrates intelligent signal preprocessing, multi-domain feature representation, temporal deep learning, and efficient inference for monitoring VLSI and embedded systems is introduced.

Anushmita Pathak, Ashwini S, Vibha S et al. · 0 citations