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Author

Bent Weber

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Preprint Aug 2026

Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes

This work constructs a universal logical gate set that is error-transparent (ET) to phase errors, and shows how logical measurement and recovery can be constructed from ET operations, and explains why state-preparation cannot be made ET.

K. Onggadinata, Si Yan Koh, Arghya Maity et al. · 0 citations

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