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Open access Sep 2026

Inference and Prediction for the Burr XII Distribution Under A Generalized Type‐III Hybrid Censoring Scheme

This paper introduces a generalized Type‐III hybrid censoring scheme for reliability data analysis. The scheme combines two failure‐number thresholds with two time limits, so that more failure information can be retained while the testing duration remains controlled. Under this censoring scheme, classical and Bayesia...

Bing Long, Dong Jiang, Qin-Yi Long · 0 citations
Conference Aug 2026

Factor Graph-Optimized Cross-Scale Detector for Wafer Defect Detection

Accurate wafer defect detection is critical for yield improvement in semiconductor manufacturing and package testing. Conventional CNN-based and Transformer-based detectors struggle to localize small defects and capture global context in low-resolution images with extreme scale variation. In this paper, we propose FGC-...

Rui Chen, Bing Long, Zhi-Jian Dai et al. · 0 citations

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