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C. Ren

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Open access Sep 2026

Novel Measurement Method for Decoupling Leakage Currents in Active-Region and Termination-Region of High-Power Semiconductors

The termination structure is regarded as a weak point of high-power semiconductor devices under blocking conditions. Measurement of the termination-region leakage current is highly beneficial for identifying the failure boundaries of devices under complex operating conditions, thereby enabling more effective guidance f...

Hong-Fan Zhu, Jia-Peng Liu, C. Ren et al. · 0 citations

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