QTL Mapping for Leaf Rust Resistance in a Wheat Recombinant Inbred Line Population of Liang66-S/Hengmai28
Leaf rust (LR), caused by Puccinia triticina, is a major constraint to global wheat production. Identifying quantitative trait loci (QTLs), conferring adult-plant resistance (APR), and developing breeder-friendly markers are essential for durable disease control. In this study, a recombinant inbred line (RIL) populatio...