Review
Open access
Aug 2026
Detecting Vulnerabilities in Embedded Systems via Taint Analysis: A Survey
This article describes and categorize embedded systems, highlights the challenges posed by embedded systems for taint analysis, examine state-of-the-art techniques, and categorize dozens of tools in this field.
Guo-Hao Wu, Hong-Liang Liang, Lu-Ming Yin et al.
· ACM Computing Surveys · 0 citations