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E. V. Wijland

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Preprint Jul 2026

Spectral Dual Fitting for $k$-Means

We give a new dual fitting algorithm which gives improved approximation ratios of $3+\ln 2 + \epsilon\ (\approx 3.694)$ and $4.9+\epsilon$ for $k$-Means in (high-dimensional) Euclidean and general metrics respectively, improving upon the previously known ratios of $4+\epsilon$ [Charikar, Cohen-Addad, Gao, Grandoni, Lee, and van Wijland STOC'26] and $5+\epsilon$ [Byrka, Guo, Hu, Li, Wan, Wang FOCS'26], resp. In particular, our result for Euclidean $k$-Means breaks the hardness barrier of $1+8/e\approx 3.94$ for Metric $k$-Means. Prior to our work, no such separation between general and Euclidean metrics was known for $k$-Median, $k$-Means, or Facility Location in terms of their approximability. Unlike prior dual fitting approaches for $k$-Means, our new dual fitting algorithm tightly accounts for dual payments while still facilitating an effective dual feasibility analysis. We introduce a new framework that uses spectral analysis for determining the approximation factor of our algorithm.

Aditya Anand, Moses Charikar, Vincent Cohen-Addad et al. · 0 citations
#natural language process... Preprint Aug 2026

TCS-BENCH: Benchmarking State-of-the-Art Generative AI Theoretical Computer Science Research Ability

We introduce TCS-Bench, a benchmark for evaluating Large Language Models (LLMs) on research-level Theoretical Computer Science (TCS) proof generation. TCS-Bench consists of theorem-proving tasks from papers published at top theoretical computer science venues (STOC, FOCS, and SODA). Each task provides the necessary context to derive a self-contained proof for a target result. We evaluate state-of-the-art models on this benchmark. We verify the correctness of generated proofs via a verification agent, and further benchmark the verifier against human-expert proof judgements on a set of target statements and generated proofs pairs. Our reference verifier achieves over 90% accuracy on the expert labeled set.

Vincent Cohen-Addad, Dimitris Paparas, E. V. Wijland et al. · 1 citation