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G. Martínez-Ponce

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Open access Oct 2026

Fourier-Based Characterization of Reflective Surface Topography Using a Heterodyne Optical Profilometer

Optical profilometry based on heterodyne interferometry was used to characterize the lateral surface topography of reflective surfaces with microstructures. A 633 nm laser beam is split into an unshifted object beam and a reference beam that is frequency-shifted by 80 MHz using a traveling-wave acousto-optic modulator....

A. Beltrán-González, G. Martínez-Ponce, Guillermo García-Torales et al. · 0 citations

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