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Haijie Qian

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Open access Sep 2026

A Submicron Soft X-ray Photoemission Beamline at Diffraction-Limited Synchrotron Light Source HEPS

A soft X-ray beamline dedicated to probing micro- and nano-scale interfacial electronic structures has been commissioned at the High Energy Photon Source (HEPS), China’s newest fourth-generation synchrotron radiation facility. Designated as the High-resolution Nanoscale Electronic Structure Beamline (High-NESS), this...

K. Tang, Chen Liu, Haijie Qian et al. · 0 citations

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