Plasma-enhanced ALD growth of high breakdown field Ga2O3
This study investigates the structural, chemical, and dielectric properties of sub-20 nm Ga2O3 thin films grown by plasma-enhanced atomic layer deposition at 250 °C using triethylgallium and oxygen plasma. The as-deposited films are amorphous and exhibit sub-nanometer surface roughness on c-plane sapphire and Si (100)...