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Jia-Xin Liu

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Conference Open access Sep 2026

On-Device Realistic Test-Time Adaptation via Bias-Resistant Statistical Alignment

Test-Time Adaptation (TTA) aims to adapt pretrained models to unseen test data, which is crucial for resource-constrained edge devices that must handle distribution shifts on the fly without human supervision. However, conventional TTA methods often fail in realistic scenarios characterized by continuous shifts and sev...

Hao-Jie Bai, Aiguo Chen, Rui-Ting Dai et al. · 0 citations

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