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Jian-Fu Zhao

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Conference Sep 2026

YOLO-MDFR-Light: a lightweight defect detection network with multi-dimensional frequency attention for industrial edge deployment

Modern deep learning object detectors with over 20 million parameters are difficult to deploy on edge devices with 2--8 GB memory. In this work, we compress YOLO11m to 7.89 M parameters, achieving a 60.8% parameter reduction with only a 1.01% mAP@50 drop for binary industrial defect classification. The backbone adopts...

Hao Chen, Pin Lv, Jian-Fu Zhao et al. · 0 citations

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