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Jian-Jun Shi

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Conference

Robust Anomaly Detection under Data Contamination for Pixel-Level Defective Region Segmentation

Industrial image-based anomaly detection plays a significant role in quality control, where pixel-level defective region segmentation is an important task to locate anomalies for various applications. Due to the data-abundance and label-scarcity nature of industrial products, the unsupervised learning approach has attr...

Yi-Feng Wang, Jian-Jun Shi, Chuck Zhang et al. · 0 citations

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