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Author

Jian-Xing Li

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2026

A Multi-DOF Cross-Scale Piezoelectric Scanning System for Microscopic Imaging

Microscopic imaging across different spatial scales requires a large travel range, high positioning resolution, flexible observation perspectives, and reliable autofocus capability. To address these challenges, this article proposes a multi-degree-of-freedom (DOF) cross-scale piezoelectric scanning system. Unlike conve...

Jian-Xing Li, Shijng Zhang, Jing-Han Guan et al. · 0 citations

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