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Jin-Zhong Xu

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Open access Oct 2026

MC-DETR: a lightweight RT-DETR method for industrial defect detection

Industrial defect detection requires accurate localization of small and irregular defects under complex backgrounds while maintaining low computational cost for deployment-oriented applications. To address the redundancy and limited small-defect representation of RT-DETR in industrial scenarios, this paper proposes MC-...

Yong-Kang Zhou, Jin-Zhong Xu, Pei-Liang Yao et al. · 0 citations

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