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Jing-Nan Fang

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Conference Aug 2026

SSC-YOLOv8n-Based Surface Defect Detection for Lathe Tools

Reliable detection of subtle defects on highly reflective lathe-tool surfaces remains difficult because conventional downsampling loses high-frequency details and background reflections obscure weak defect responses. This paper proposes SSC-YOLOv8n, an improved YOLOv8n detector that integrates spatial-to-depth convolut...

Yuan Peng, Jing-Nan Fang, Si-Cheng Wan et al. · 0 citations

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