Preprint
Sep 2026
Pushing the Dose Limit of Atomic-Resolution Imaging: A 4D-STEM case study of NaCl
Beam-induced damage fundamentally limits the characterization of beam-sensitive materials by scanning transmission electron microscopy (STEM), since structural information must be recorded before the electron beam irreversibly modifies the specimen. Here, sodium chloride (NaCl) is employed as a model beam-sensitive ion...
Tamazouzt Chennit, A. Annys, Song-Ge Li et al.
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