Open access
Oct 2026
DAF-YOLO for Detecting Small Defects with Weak Visual Features on Chip Surfaces
The proposed DAF-YOLO model, an enhanced YOLO11 model for detecting small defects with weak visual features on chip surfaces, incorporates a dual-pooling channel-spatial attention module (DPCSA) to strengthen salient responses in small-defect regions and suppress interference from complex background textures.
Kai-Wei Wang, Ji-Nan Gu, Juan Huang
· Engineering Research Express · 0 citations