Sep 2026
AI-driven artifact removal and image restoration in Atomic Force Microscopy via structured mask-guided inpainting.
High-resolution Atomic Force Microscopy (AFM) serves as a foundational smart sensing technology for nanoscale characterization, yet raw topographical data is heavily degraded by spatial distortions and scanning artifacts. Standard image correction workflows depend on manual intervention or generic algorithms that ignor...
Jun-Tao Zhang, Angona Biswas, J. Rade et al.
· Micron · 0 citations