Preprint
Aug 2026
Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes
This work constructs a universal logical gate set that is error-transparent (ET) to phase errors, and shows how logical measurement and recovery can be constructed from ET operations, and explains why state-preparation cannot be made ET.
K. Onggadinata, Si Yan Koh, Arghya Maity et al.
· 0 citations