Open access
Sep 2026
Computational modeling of catastrophic fault classification in Digital to Analog Converters using machine learning
This study compares the performance of Back Propagation Neural Network, Support Vector Machine, and Probabilistic Neural Network to classify catastrophic faults in both 16-bit Charge Scaling and Binary Weighted DACs that have experienced process variation such as variable threshold voltage, oxide thickness and temperat...
V. Govindaraj, M. Sheela, M. Muthuraja et al.
· Discover Computing · 0 citations