Kaushik Bhattacharya

Physics-aware global Rietveld refinement for high-energy X-ray diffraction microscopy with application to reconstructing intragranular orientation and strain fields

High-energy X-ray diffraction microscopy (HEDM) has emerged as a critical technique for studying the microstructure and, increasingly, strain fields in solids. However, current algorithmic or experimental methods to obtain intragranular fields are time-intensive, provide limited spatial resolution, or yield stress and...