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Li-Zhen Fang

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Conference Sep 2026

Research on precision industrial defect detection assisted by vision foundation models

Industrial defect inspection needs to handle micro-scale objects, weak contrast, irregular boundaries and frequent domain shifts. Conventional closed-set detectors are also dependent on category-specific annotations. VFM-PDI is a new high precision inspection method based on a vision foundation model. VFM-PDI is compos...

Li-Zhen Fang, Xin-Yu Cao, Lian-Jiang Zhu et al. · 0 citations

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