Nasrullah Khan

Robust Attribute Control Chart for Median‐Truncated Life Tests Under the Odd Exponential Half‐Logistic Distribution

In this research, an attribute control chart is developed in order to monitor the product lifetimes having odd exponential half‐logistic distribution (OEHLD) with truncated life tests. The novelty of the suggested scheme is in truncation time that is assumed to be a multiple of the median of lifetime distribution ins...