Preprint
Jul 2026
Automating the analysis of micron-scale synchrotron diffraction data on inhomogeneous polycrystalline samples: a solid oxide electrolysis cell case study
A novel approach to post mortem characterisation of electrochemical and photovoltaic devices is spatially-resolved diffraction using a hyper-focused, micron-width x-ray beam to examine the distribution of degradation products and strain, a technique called $\mu$-XRD. Aside from the experimental difficulties associated...
L. Nagle-Cocco, C. Crain, Michael J. Dzara et al.
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