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Nils-Malte Jahn

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Open access Sep 2026

Integrated Over-Current and Temperature Monitoring in SiC MOSFETs Using Single-Pad Dual-Mode Sensing

The detection of over-currents and short-circuit currents, as well as monitoring the silicon carbide (SiC) MOSFET device temperatures during run-time, is a crucial requirement for reliable power electronics. Currently, integrating device-level sensor features increases the complexity of the manufacturing process and ad...

Julius Schapdick, Nils-Malte Jahn, T. Reiter · 0 citations

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