Interleaving dielectric layers into ferroelectric Hf0.5Zr0.5O2 (HZO) films increases the memory window (MW) beyond what is accounted for by the dielectric constants. Determining the physical mechanisms behind these MW improvements is critical to reaching the full potential of HZO FeNAND. Here, we show that MW improveme...
Marshall B. Frye, Chanyoung Kim, Jeong-Woo Sun et al.· 0 citations
This paper extends the validation of QRMI to a broad range of workload managers, including PBS, LSF, Grid Engine, Kubernetes, and the Flux Framework, encompassing traditional batch schedulers, a cloud-native orchestration platform, and a graph-based scheduler.
Thomas Badts, T. Boyle, Claudio Carvalho et al.· arXiv.org· 4 citations
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