Author

Ouiem Bchir

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Open access Sep 2026

Beyond Pseudo-Labels: Dual-Level Knowledge Distillation for Enhanced Deep Clustering

TSDC outperformed existing deep clustering frameworks, yielding improved classification accuracy and the most prominent improvement was observed on CIFAR-100, where classification accuracy rose from 54.77 ± 0.07 to 57.58 ± 1.85.

Rehab Alnefaie, M. B. Ben Ismail, Ouiem Bchir · Algorithms · 0 citations

Open access Aug 2026

Weighted Deep Embedded Clustering for Robust Representation Learning in Noisy Data

A Reliability-Based Deep Embedded Clustering (RDEC) approach that improves clustering reliability through a novel distance-aware weighting strategy, coupled with a novel Kullback–Leibler divergence objective function to focus on the most representative data instances and guide the clustering process.

Meaad Altwaimi, M. B. Ben Ismail, Ouiem Bchir · Algorithms · 0 citations