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Sponsored Design Multi-Agent AI Systems Using MCP and A2A: Engineer your own Pyt Design Multi-Agent AI Systems Using MCP and A2A: Engineer your own Pyt

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René Barczyk

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Conference Open access 2026

Inspection and Defect Detection Using Digital Holography for Advanced Packaging

Advanced packaging processes such as hybrid bonding require defect-free surfaces with nanometre-level cleanliness. Conventional bright-field and dark-field inspection struggle on patterned substrates: bright-field contrast is dominated by the nominal pattern, while dark-field is overwhelmed by diffracted orders from pe...

Balasubrahmaniyam Mukundakumar, René Barczyk, Shimpei Matsuura · 0 citations

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