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Ruo-Du Wang

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Preprint Oct 2026

E-Backtesting Expected Shortfall without Value-at-Risk Forecasts under Time-series Models

Expected Shortfall (ES) measures the average size of tail losses. Its sequential backtests typically also require a Value-at-Risk (VaR) forecast. We develop two e-backtesting methods using only observed losses and ES forecasts: one for iid losses only and the other for time series under an AR-GARCH conditional VaR stru...

Ruo-Du Wang, Jing-Cheng Yu · 0 citations

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