Sang Yun Kim

Risk-Guided Intensity Mapping for Mitigating Amplification Artifacts in Low-Light Image Enhancement

Low-light image enhancement (LIE) often suffers from undesirable noise amplification in dark regions. In addition, learning-based LIE methods may produce excessive amplification artifacts when misapplied to normal-light images. To address these issues, we propose a lightweight post-processing framework called risk-guid...