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Sean Yenyu Lai

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#diffusion models Open access Oct 2026

Microalloying Impact and Damage Mechanisms in Sn-Bi and Sn-Ag-Cu Based Solder Alloys: Constitutive Behavior and Fatigue Reliability

Solder interconnects are critical mechanical and electrical elements in electronic packages, and their reliability depends strongly on alloy composition, processing condition, use temperature, strain rate, creep deformation, and fatigue loading. As electronic packaging continues to move toward finer pitch, larger packa...

Sean Yenyu Lai · 0 citations

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