Scanning probe microscopy (SPM) has become a mainstay of materials science, condensed matter physics, nanotechnology, biology, and semiconductor metrology. An SPM image, however, is acquired sequentially as the probe traverses the surface under closed-loop feedback while thermal drift, feedback dynamics, tip state, mec...
Surya Prakash Reddy, Sergei V. Kalinin· 0 citations
This paper formalizes constraints as causal zeros within an Extended Causal Model by adding an activation operator, subject to local solvability and graph-admissibility conditions, and gives the extended do-calculus, identifiability conditions, counterfactual semantics, and open problems.
Sergei V. Kalinin· arXiv.org· 0 citations
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