CDGP: Contrastive Dual Gaussian Processes for Weakly Supervised Anomaly Segmentation
Industrial visual inspection must both decide whether a product is defective and localize the defect, yet pixel-level masks are costly to collect at scale. Most anomaly-segmentation methods learn only from defect-free images and score deviations from normality. A true defect and an unusual-but-normal region, however, c...