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Sponsored Artificial Intelligence: A Modern Approach, Global Edition Artificial Intelligence: A Modern Approach, Global Edition

Author

Si-Cheng Wan

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Conference Aug 2026

SSC-YOLOv8n-Based Surface Defect Detection for Lathe Tools

Reliable detection of subtle defects on highly reflective lathe-tool surfaces remains difficult because conventional downsampling loses high-frequency details and background reflections obscure weak defect responses. This paper proposes SSC-YOLOv8n, an improved YOLOv8n detector that integrates spatial-to-depth convolut...

Yuan Peng, Jing-Nan Fang, Si-Cheng Wan et al. · 0 citations
Conference Aug 2026

LE-YOLO for Lightweight Tiny Defect Detection on Printed Circuit Boards

It is challenging to detect tiny surface defects on printed circuit boards (PCBs) due to their small size, elongated features, and the complex textured background. This paper develops Lightweight Edge-guided YOLO(LE-YOLO), a lightweight detector based on YOLOv8n. First, a lightweight cross-layer output reconstruction s...

Guang-Guang Yang, Yu-Cheng Yu, Si-Cheng Wan et al. · 0 citations

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