Open access
Aug 2026
Self-supervised image denoising and restoration method for atomic force microscopy
Scanning probe microscopy (SPM) distinguishes itself from light and electron microscopy by sensing surface interactions with a nanoscale probe, rather than relying on the detection of particles or waves; and has evolved into a versatile tool across several fundamental and applied research fields. SPM uses raster-scanni...
Si-Chen Pan, Simon Scheuring
· Nature Communications · 0 citations