Preprint
Aug 2026
Near-optimal quantum metrology with few-qubit measurements
Quantum metrology, which addresses parameter estimation in quantum systems, has broad applications across science and technology. Conventional metrology protocols for multi-qubit states in the multi-parameter regime typically require highly complex quantum measurements, leading to substantial quantum-resource costs. In...
Liang Mao, Senrui Chen, Hsin-Yuan Huang et al.
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