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Stephan Howden

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Open access Sep 2026

Processing-induced uncertainty in MEMS-derived significant wave height estimates without attitude measurements

Significant wave height (SWH) derived from compact microelectromechanical systems (MEMS) is increasingly used for operational wave monitoring, but estimates can vary depending on the scientifically defensible processing choices applied to the same inertial record. This study evaluates method-selection variab...

Johnson O. Oguntuase, Vishwamithra Sunkara, Stephan Howden · 0 citations

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