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Sponsored AI AM CLAUDE, A Beginner's Guide: Learn the basics of working with AI AI AM CLAUDE, A Beginner's Guide: Learn the basics of working with AI

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Tian-Ping Luo

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Conference Aug 2026

CDS-YOLO: Industrial Surface Defect Detection Based on an Improved YOLO11 Framework

Industrial surface defect detection is simultaneously constrained by weak-contrast small targets, strong textural backgrounds, and directional structures. Although existing real-time YOLO methods offer high speed, neck enhancements often lack scale-specific functional partitioning, edge information is easily entangled...

Tian-Ping Luo · 0 citations

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