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Ting-Wei Lu

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Open access Oct 2026

Learning Constrained Embeddings for Anomaly Region Localization

Industrial Anomaly Detection (IAD) aims to determine whether a product image contains defects and to localize anomalous regions. Since real anomalies are scarce, diverse, and difficult to acquire, many IAD methods rely on synthetic anomalies for training. However, localization performance heavily depends on how well sy...

Ting-Wei Lu, Chih-Chang Yu, Hsu-Yung Cheng · 0 citations

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