Yao-Yin Chen

Validation-uided Lightweight Attention for Small Chip Surface Defect Detection

Validation-Guided Lightweight Attention for Small Chip Surface Defect Detection

Small chip-surface defects are difficult to detect because they occupy few pixels and vary across acquisition domains. This study develops a compact YOLOv8n detector through controlled, validation-only ablations while preserving a held-out test set for later model development. The dataset comprised 3,511 real chip imag...