Yi-Wun Wang

Physics-based damage prediction index model and angle-matched ultrafast-laser chamfering of amorphous glass substrates

Ultrafast-laser chamfering of amorphous glass substrates is limited by subsurface lateral cracking. Guided by a cause-and-effect (Ishikawa) screening that identified the laser incidence angle as the dominant controllable lever, we formulate a physics-based, semi-empirical Damage Index Ψ = k0 ⋅ M ⋅ Φ ⋅ P, coupling geome...