A Submicron Soft X-ray Photoemission Beamline at Diffraction-Limited Synchrotron Light Source HEPS
A soft X-ray beamline dedicated to probing micro- and nano-scale interfacial electronic structures has been commissioned at the High Energy Photon Source (HEPS), China’s newest fourth-generation synchrotron radiation facility. Designated as the High-resolution Nanoscale Electronic Structure Beamline (High-NESS), this...