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Yun-Gu Lee

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Open access 2026

Risk-Guided Intensity Mapping for Mitigating Amplification Artifacts in Low-Light Image Enhancement

Low-light image enhancement (LIE) often suffers from undesirable noise amplification in dark regions. In addition, learning-based LIE methods may produce excessive amplification artifacts when misapplied to normal-light images. To address these issues, we propose a lightweight post-processing framework called risk-guid...

Sang Yun Kim, Jenn-Tai Hwang, Yun-Gu Lee · 0 citations

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