Preprint
Sep 2026
Multi-Angle Beam Scanning Transmission Electron Microscopy for Diffraction-Contrast-Free Magnetic Imaging
Recent development of the differential phase contrast (DPC) scanning transmission electron microscopy (STEM) technique has significantly advanced materials science supported by high-sensitivity detectors and powerful data processing. Especially the 4D-STEM technique, employing a pixelated camera as a STEM detector, ena...
A. Yasuhara, Z. Akase, Takumi Sannomiya
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